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OMICRON Product Line
FOCUS-PEEM without Integral Sample Stage (Basic Version)
In special cases it may be necessary to have the sample mounted on a separate manipulator, which is not compatible with the
integral sample stage of the IS-PEEM. For such applications this ‘Basic Version’ is used. It is self evident that this arrangement may give rise to sample vibrations and/or sample drift, which both
will diminish resolution. Furthermore, when taking difference-images (e.g. for elemental imaging or magnetic domain imaging) at typical exposure times of several 10 seconds, any thermal drift of the
manipulator will cause fringes or even spoil the difference image. Consequently, in all cases where a separate manipulator is indispensable, care must be taken to avoid any mechanical movement of the
sample. A mechanical ‘lock’ in the PEEM-position might be valuable for gaining maximum resolution.
Applications
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