FOCUS electronics

Instruments for Electron Spectroscopy and Surface Analytics

IEF: Micro- UPS and spectroscopic imaging

IEF- images, taken with retarding field energies G. Note, that the resolution
is clearly improved in the band-pass difference image C.
Sample: Pd: Ti/Si- Gitter, hv =4.9 eV (Hg high pressure excitation lamp).

PdSiTidifferenceimage01.jpg (36159 Byte)

Comparison between IEF (retarding field analyser) and EA125 (energy dispersive
electron analyser). Sample: Pd: Ti/Si- Gitter, hv =21.2eV (HeI).

IEFEA125_V1.jpg (81807 Byte)

Sample: Pd: Ti/Si- Gitter, hv =16.8eV (NeI).

PdSiTidifferenceimage02.jpg (67776 Byte)

difference images with highly improved material contrast:

PdSiTidifferenceimage03.jpg (94492 Byte)