LITERATURE - a selection
Spectroscopy
G.H. Fecher, Ch. Grünewald, M. Merkel, Ch. Ostertag, A. Oelsner, G. Schönhense, Th. Jentzsch, H.J. Jüppner
Circular dichroism in angular resolved photoemission from pure and Rb-doped C60 and C22H14 layers on platinum and tungsten
Thin Solid Films 303 (1997) 58
M. Getzlaff, B. Heidemann, J. Bansmann, C. Westphal, G. Schönhense
A variable-angle electron spin polarization detection system
Rev. Sci. Instrum. 69 (1998) 3913
A. Oelsner, G. H. Fecher
Photoelectron holography using circularly polarized light
J. Electron Spectrosc. Relat. Phenom. 101-103 (1999) 455
M. Schicketanz, A. Oelsner, J. Morais, Th. Jentzsch, G.H. Fecher, G. Schönhense
The dependence of circular dichroism in photoemission on the optical properties of Cs monolayers on Pt (111)
Surf. Sci. 377-379 (1997) 432
(Spectro-)microscopy
K. Grzelakowski
The novel surface science instrument: Double reflection electron emission microscope
Rev. Sci. Instrum. 70 (1999) 3346
P. Hoffmann, R. P. Mikalo, D. Schmeißer
Photoemissionselektronenmikroskopie
Vakuum in Forschung und Praxis 1 (1999) 37
Y. Hwu
Photoelectron spectromicroscopy as a microchemical probe of high temperature superconductors
J. Electron Spectrosc. Relat. Phenom. 84 (1997) 149
S. Imada, S. Ueda, R.J. Jung, Y. Saitoh, M. Kotsugi, W. Kuch, J. Gilles, S.S. Kang, F. Offi, J. Kirschner, H.
Daimon, T. Kimura, J. Yanagisawa, K. Gamo and S. Suga
Metastable domain structures of ferromagnetic microstructures observed by soft X-ray magnetic circular dichroism microscopy
Jap. J. Appl. Phys. Part 2-Letters 39 (2000) L585
W. Kuch, R. Frömter, J. Gilles, D. Hartmann, Ch. Ziethen, C.M. Schneider, G. Schönhense, W. Swiech, J. Kirschner
Element-selective magnetic imaging in exchange-coupled systems by magnetic photoemission microscopy
Surf. Rev. Lett. 5 (1998) 1241
W. Kuch, J. Gilles, F. Offi, S.S. Kang, S. Imada, S. Suga and J. Kirschner
Imaging microspectroscopy of Ni/Fe/Co/Cu(001) using a photoemission microscope
J. Electron Spectrosc. Relat. Phenom. 109 (2000) 249
W. Kuch, J. Gilles, S.S. Kang, S. Imada, S. Suga and J. Kirschner
Magnetic circular dichroism microspectroscopy at the spin-reorientation transition in Ni(001) films
Phys. Rev. B 62 (2000) 3824
W. Kuch, W., J. Gilles, S.S. Kang, F. Offi, J. Kirschner, S. Imada and
S. Suga
Quantitative x-ray magnetic circular dichroism microspectroscopy of Fe/Co/Cu(001) using a
photoemission microscope
J. of Appl. Phys. 87 (2000) 5747
M. Merkel, M. Escher, J. Settemeyer, D. Funnemann, A. Oelsner, Ch. Ziethen, O. Schmidt, M. Klais, G. Schönhense
Microspectroscopy and Spectromicroscopy with PEEM using an new kind of Imaging Energy Filter
Surf. Sci. 480 (2001) 196
S.A. Nepijko, N. N. Sedov, G. Schönhense, M. Escher, B. Xinhe, H. Weixin
Resolution deterioration in emission electron microscopy due to object roughness
Ann. Phy. 9 (2000) 441
S.A. Nepijko, N. N. Sedov, Ch. Ziethen, G. Schönhense, M. Merkel, M. Escher
Pecularities of imaging one- and two-dimensional structures in an emission electron microscope. 1. Theory
J. Microsc. 199 (2000) 124
O. Schmidt, Ch. Ziethen, G.H. Fecher, M. Merkel, M. Escher, D. Menke, U. Kleineberg, U.
Heinzmann, G. Schönhense
Chemical Microanalysis by selected-area ESCA using an electron energy filter in a
photoemission microscope
J. Electron Spectrosc. Relat. Phenom. 88-91 (1998) 1009
H. Spiecker, O. Schmidt, Ch. Ziethen, D. Menke, U. Kleineberg, U. Heinzmann, R. Ahuja, M. Merkel, G. Schönhense
"Time-of-flight photoelectron emission microscopy TOF-PEEM. First results."
Nucl. Instrum. Meth. A 406 (1998) 499
G. Schönhense
Imaging of magnetic structures by photoemission electron microscopy
J. Phys.:Condens. Matter 11 (1999) 9517
Ch. Ziethen, O. Schmidt, G.K.L. Marx, G. Schönhense, R. Frömter, J. Gilles,
J. Kirschner, C.M. Schneider, O. Gröning
Orbital Mapping of carbon thin films by XANES-spectromicroscopy
J. Electron Spectrosc. Relat. Phenom. 107 (2000) 261
Ch. Ziethen, O. Schmidt, G.H. Fecher, C. M. Schneider, G. Schönhense, R. Frömter,
M. Seider, K. Grzelakowski, M. Merkel, D. Funnemann, W. Swiech, H. Gundlach, J. Kirschner
Fast
elemental Mapping and Magnetic Imaging with High Lateral Resolution Using a Novel Photoemission Microscope
J. Electron Spectrosc. Relat. Phenom. 88-91 (1998) 983
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