Secondary electron microscopy
with polarization analysis:
The FOCUS SEMPA detector

A SEMPA detector (SEM with Polarisation Analysis) allows the researcher to investigate the magnetic domain structure simultaneously, at the same spot, with a resolution in the 10 nm range. With this combination the electron transport in dependence of the pattern shape and magnetic domain structure can be studied and optimized. The spin detector collects the secondary electrons from the sample like in conventional SEM, but instead of a simple secondary electron (SE) image based on the number of secondary electrons arriving for each pixel, it detects the orientation of the spin of these electrons. Our SEMPA detector is based up to now on the
SPLEED principle.

Schematic setup:

Some figures related to the commercial realization with the
ScientaOmicron UHV NanoSAM: