News

As sample preparation is key in surface science, high purity and flexible sputter ion sources are of essence. The FDG 15/150 hot filament ion sources meet all requirements from threshold near low energy sputtering to rasterized fine focus operation for...

The new date for our 8th FOCUS PEEM Workshop is June 16 th  to 18 th  2021 ! However, thanks to the significant support from the invited speakers we are very pleased to present their talks here on the FOCUS webpage.

NanoESCA III with 2D Imaging Spinfilter soon accessible for scientific and industry user operation @ ELI-ALPS

We are proud to announce that the completely revised website finally went online replacing the old website! We hope you enjoy the new & better navigation! Old Website New Website

Despite everything, we are 100% available! At first: We hope you all are fine! We would like to inform you that we here at FOCUS do whatever possible to make sure we are close to 100% normal operation. As in most other companies for...

The 8th PEEM WORKSHOP 2020 has been postponed to 2021! Please stay updated here . Since 2005 FOCUS is organizing a PEEM user Workshop in a regular manner. The workshop is addressed to all researchers who are interested in PEEM no...

Dec 2019: Imaging 2D Spinfilter Since Nov. 2019 FOCUS has an agreement for legal and technical rights with the licensor of the patent of the 2D Spinfilter: Company Surface Concept Gmbh, Protecting German Patents: DE102005045622B4, DE102010010981B4....