Season’s Greetings 19. December 2021 Dear customers, dear business partners, dear employees and dear relatives of our employees! The year 2021 is drawing to a […]
Microscopy with Momentum and Imaging Spin-Filter (Au/Ir) 10. December 2021 Our new poster gives you fascinating insights into the new Imaging Spin-Filter product, which is an add-on to the popular NanoESCA analyzer. It […]
Photoemission Tomography: Applications and Future Developments 27. October 2021 It was a pleasure for us to be part of the 734. WE-Heraeus Seminar “Photoemission Tomography: Applications and Future Developments” […]
ALC 2021 13. October 2021 Prof. Neil Fox from the University of Bristol and the Bristol NanoESCA facility will give a Tutorial talk about “Energy-filtered Spectromicroscopy with a Laser-Driven, […]
NanoESCA – BTU Cottbus – Momentum Microscopy 19. September 2021 For the Brandenburgische Technische Universität Cottbus-Senftenberg Summer School we merged the working principal of Momentum Microscopy in one comprehensive graphic: The whole photo-electron angular distribution […]
XPS Topic Collection 10. August 2021 We just got our print of the JVST Special Topic Collection “Reproducibility Challenges and Solutions with a Focus on XPS”. […]
Focus Peem Workshop 2021 – It’s a Wrap! 19. June 2021 We thank all attendees and contributors for this great FOCUS PEEM workshop 2021. We got a lot of very positive […]
1 More Week until the Workshop starts! 9. June 2021 In one week we will start our 8th PEEM workshop, for the first time as online event. That allows more […]
PEEM Workshop 12. May 2021 You are cordially invited to attend our 8 𝐭𝐡 𝐅𝐎𝐂𝐔𝐒 𝐏𝐄𝐄𝐌 𝐖𝐨𝐫𝐤𝐬𝐡𝐨𝐩, which will be held in an online format jointly […]
HAXPEEM – Hard X-Ray 23. April 2021 𝐅𝐎𝐂𝐔𝐒 unique 𝐇𝐀𝐗𝐏𝐄𝐄𝐌 with patented 𝐱𝐓𝐎𝐅 highlighted in the Hard X-ray review paper of Anna Regoutz et al: “Furthermore, HAXPEEM […]
Imaging 2D Spinfilter Paper 29. January 2021 𝗡𝗮𝗻𝗼𝗘𝗦𝗖𝗔 with 𝗜𝗺𝗮𝗴𝗶𝗻𝗴 𝟮𝗗 𝗦𝗽𝗶𝗻𝗳𝗶𝗹𝘁𝗲𝗿, the ideal platform for Spin-Resolved 𝗠𝗼𝗺𝗲𝗻𝘁𝘂𝗺 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 In this study Ewa Mlynczak et al has […]
New FDG Brochure 17. November 2020 As sample preparation is key in surface science, high purity and flexible sputter ion sources are of essence. The FDG […]
New Products 26. March 2020 Dec 2019: Imaging 2D Spinfilter Since Nov. 2019 FOCUS has an agreement for legal and technical rights with the licensor […]
Dear customers, dear business partners, dear employees and dear relatives of our employees! The year 2021 is drawing to a […]
Our new poster gives you fascinating insights into the new Imaging Spin-Filter product, which is an add-on to the popular NanoESCA analyzer. It […]
It was a pleasure for us to be part of the 734. WE-Heraeus Seminar “Photoemission Tomography: Applications and Future Developments” […]
Prof. Neil Fox from the University of Bristol and the Bristol NanoESCA facility will give a Tutorial talk about “Energy-filtered Spectromicroscopy with a Laser-Driven, […]
For the Brandenburgische Technische Universität Cottbus-Senftenberg Summer School we merged the working principal of Momentum Microscopy in one comprehensive graphic: The whole photo-electron angular distribution […]
We just got our print of the JVST Special Topic Collection “Reproducibility Challenges and Solutions with a Focus on XPS”. […]
We thank all attendees and contributors for this great FOCUS PEEM workshop 2021. We got a lot of very positive […]
In one week we will start our 8th PEEM workshop, for the first time as online event. That allows more […]
You are cordially invited to attend our 8 𝐭𝐡 𝐅𝐎𝐂𝐔𝐒 𝐏𝐄𝐄𝐌 𝐖𝐨𝐫𝐤𝐬𝐡𝐨𝐩, which will be held in an online format jointly […]
𝐅𝐎𝐂𝐔𝐒 unique 𝐇𝐀𝐗𝐏𝐄𝐄𝐌 with patented 𝐱𝐓𝐎𝐅 highlighted in the Hard X-ray review paper of Anna Regoutz et al: “Furthermore, HAXPEEM […]
𝗡𝗮𝗻𝗼𝗘𝗦𝗖𝗔 with 𝗜𝗺𝗮𝗴𝗶𝗻𝗴 𝟮𝗗 𝗦𝗽𝗶𝗻𝗳𝗶𝗹𝘁𝗲𝗿, the ideal platform for Spin-Resolved 𝗠𝗼𝗺𝗲𝗻𝘁𝘂𝗺 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 In this study Ewa Mlynczak et al has […]
As sample preparation is key in surface science, high purity and flexible sputter ion sources are of essence. The FDG […]
Dec 2019: Imaging 2D Spinfilter Since Nov. 2019 FOCUS has an agreement for legal and technical rights with the licensor […]