• Dylan James Scientific at The Advanced Materials Show 2022
    At the Advanced Materials Show, NEC Birmingham, Martyn Green represented us highlighting the wide range of our FOCUS product line! Thank you, […]
  • HIS Mono – VUV Monochromator for HIS 13 / HIS 14
    Vacuum ultraviolet light is the dominant continuous excitation for band structure analysis using PES and ARPES as well as for PEEM […]
  • Season’s Greetings
    Dear customers, dear business partners, dear employees and dear relatives of our employees! The year 2021 is drawing to a […]
  • Microscopy with Momentum and Imaging Spin-Filter (Au/Ir)
    Our new poster gives you fascinating insights into the new Imaging Spin-Filter product, which is an add-on to the popular NanoESCA analyzer. It […]
  • Photoemission Tomography: Applications and Future Developments
    It was a pleasure for us to be part of the 734. WE-Heraeus Seminar “Photoemission Tomography: Applications and Future Developments” […]
  • ALC 2021
    Prof. Neil Fox from the University of Bristol and the Bristol NanoESCA facility will give a Tutorial talk about “Energy-filtered Spectromicroscopy with a Laser-Driven, […]
  • NanoESCA – BTU Cottbus – Momentum Microscopy
    For the Brandenburgische Technische Universität Cottbus-Senftenberg Summer School we merged the working principal of Momentum Microscopy in one comprehensive graphic: The whole photo-electron angular distribution […]
  • XPS Topic Collection
    We just got our print of the JVST Special Topic Collection “Reproducibility Challenges and Solutions with a Focus on XPS”. […]
  • Focus Peem Workshop 2021 – It’s a Wrap!
    We thank all attendees and contributors for this great FOCUS PEEM workshop 2021. We got a lot of very positive […]
  • 1 More Week until the Workshop starts!
    In one week we will start our 8th PEEM workshop, for the first time as online event. That allows more […]
  • PEEM Workshop
    You are cordially invited to attend our 8 𝐭𝐡 𝐅𝐎𝐂𝐔𝐒 𝐏𝐄𝐄𝐌 𝐖𝐨𝐫𝐤𝐬𝐡𝐨𝐩, which will be held in an online format jointly […]
  • HAXPEEM – Hard X-Ray
    𝐅𝐎𝐂𝐔𝐒 unique 𝐇𝐀𝐗𝐏𝐄𝐄𝐌 with patented 𝐱𝐓𝐎𝐅 highlighted in the Hard X-ray review paper of Anna Regoutz et al: “Furthermore, HAXPEEM […]
  • Imaging 2D Spinfilter Paper
    𝗡𝗮𝗻𝗼𝗘𝗦𝗖𝗔 with 𝗜𝗺𝗮𝗴𝗶𝗻𝗴 𝟮𝗗 𝗦𝗽𝗶𝗻𝗳𝗶𝗹𝘁𝗲𝗿, the ideal platform for Spin-Resolved 𝗠𝗼𝗺𝗲𝗻𝘁𝘂𝗺 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 In this study Ewa Mlynczak et al has […]
  • New FDG Brochure
    As sample preparation is key in surface science, high purity and flexible sputter ion sources are of essence. The FDG […]
  • New Products
    Dec 2019: Imaging 2D Spinfilter Since Nov. 2019 FOCUS has an agreement for legal and technical rights with the licensor […]