NanoESCA III

Next Generation Photoemission Tool for Real- and Momentum Microscopy.
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PEEM

Photoemission Electron Microscope with various types of energy filter for real space- and momentum microscopy.
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Ion Sources

Focused hot filament Ion sources for ultra clean sample preparation and XPS/Auger depth profiling.
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EFM Evaporators

Electron beam evaporator in various configurations for ultra clean thin film and sub monolayer deposition under UHV conditions for surface science.
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Spin Analysis

Electron polarisation detectors based on electron scattering at different single crystals/epitactic thin films.
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Photon Sources

Vacuum Ultra Violet and Mercury light sources for photoelectron spectroscopy and photoemission electron microscopy.
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