HAXPEEM – Hard X-Ray

𝐅𝐎𝐂𝐔𝐒 unique 𝐇𝐀𝐗𝐏𝐄𝐄𝐌 with patented 𝐱𝐓𝐎𝐅 highlighted in the Hard X-ray review paper of Anna Regoutz et al:

“Furthermore, HAXPEEM can be combined with a 2D imaging spin-filter behind the double-hemispheres as well as with an additional time-of-flight (ToF) detector. The latter approach, referred to as xToF, uses the doublehemispherical analyser as a band pass filter to limit the electron energy distribution to an optimal energy window for the subsequent ToF energy-filter”